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{ "item_title" : "Design, Analysis and Test of Logic Circuits Under Uncertainty", "item_author" : [" Smita Krishnaswamy", "Igor L. Markov", "John P. Hayes "], "item_description" : "Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/9/04/819/643/9048196434_b.jpg", "price_data" : { "retail_price" : "109.99", "online_price" : "109.99", "our_price" : "109.99", "club_price" : "109.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Design, Analysis and Test of Logic Circuits Under Uncertainty|Smita Krishnaswamy

Design, Analysis and Test of Logic Circuits Under Uncertainty

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Overview

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.

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Details

  • ISBN-13: 9789048196432
  • ISBN-10: 9048196434
  • Publisher: Springer
  • Publish Date: September 2012
  • Dimensions: 9.2 x 6 x 0.5 inches
  • Shipping Weight: 0.8 pounds
  • Page Count: 124

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