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Design, Analysis and Test of Logic Circuits Under Uncertainty
Other Available Formats
Overview
Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.
This item is Non-Returnable
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Details
- ISBN-13: 9789048196432
- ISBN-10: 9048196434
- Publisher: Springer
- Publish Date: September 2012
- Dimensions: 9.2 x 6 x 0.5 inches
- Shipping Weight: 0.8 pounds
- Page Count: 124
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