{ "item_title" : "High Resolution X-Ray Diffractometry And Topography", "item_author" : [" D. K. Bowen", "Brian K. Tanner "], "item_description" : "The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/0/85/066/758/0850667585_b.jpg", "price_data" : { "retail_price" : "265.00", "online_price" : "265.00", "our_price" : "265.00", "club_price" : "265.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

Overview

Customers Also Bought

Details