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{ "item_title" : "Lifetime Reliability-Aware Design of Integrated Circuits", "item_author" : [" Mohsen Raji", "Behnam Ghavami "], "item_description" : "This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. ", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/3/03/115/344/3031153448_b.jpg", "price_data" : { "retail_price" : "99.99", "online_price" : "99.99", "our_price" : "99.99", "club_price" : "99.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Lifetime Reliability-Aware Design of Integrated Circuits|Mohsen Raji

Lifetime Reliability-Aware Design of Integrated Circuits

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Overview

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.

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Details

  • ISBN-13: 9783031153440
  • ISBN-10: 3031153448
  • Publisher: Springer
  • Publish Date: November 2022
  • Dimensions: 9.21 x 6.14 x 0.31 inches
  • Shipping Weight: 0.78 pounds
  • Page Count: 107

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