{ "item_title" : "A Next Generation Sampling Comparator Probe for the NIST Sampling Waveform Analyzer", "item_author" : [" U. S. Department of Commerce "], "item_description" : "The design and performance of a Next Generation Sampling Comparator Probe (NGSCP) is described. It is intended as one of a group of probes designed for use with the NIST Sampling Waveform Analyzer (SWA). The probe design is centered on an application specific integrated circuit (ASIC) analog comparator featuring a bandwidth of 6 GHz. The design considerations of the ASIC analog comparator and the probe are discussed. The probe's performance features are compared against a previously designed ASIC probe. In addition to the design aspects of the probe, a thermal error correction technique is described which shows how high-speed settling performance can be enhanced. This technical note provides complete schematic diagrams of the ASIC comparator and the probe.", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/1/49/474/385/149474385X_b.jpg", "price_data" : { "retail_price" : "15.99", "online_price" : "15.99", "our_price" : "15.99", "club_price" : "15.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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