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{ "item_title" : "Advanced Information-Measuring Technologies and Systems I", "item_author" : [" Volodymyr Eremenko", "Artur Zaporozhets "], "item_description" : "The book presents the main scientific directions and issues of research conducted in the Department of Information and Measurement Technologies at the National Technical University of Ukraine Ihor Sikorskyi Kyiv Polytechnic Institute. The presented results cover almost all scientific directions related to information and measurement technologies--metrological support of measurement channels of information and measurement systems, methods of reproducing units of electric circuit parameters, development of specialized information and measurement systems, mathematical methods of processing measurement information, models of formation of information signals and fields, statistical diagnostic methods, information support of testing, and calibration laboratories.", "item_img_path" : "https://covers3.booksamillion.com/covers/bam/3/03/140/717/3031407172_b.jpg", "price_data" : { "retail_price" : "179.99", "online_price" : "179.99", "our_price" : "179.99", "club_price" : "179.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Advanced Information-Measuring Technologies and Systems I|Volodymyr Eremenko

Advanced Information-Measuring Technologies and Systems I

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Overview

The book presents the main scientific directions and issues of research conducted in the Department of Information and Measurement Technologies at the National Technical University of Ukraine "Ihor Sikorskyi Kyiv Polytechnic Institute". The presented results cover almost all scientific directions related to information and measurement technologies--metrological support of measurement channels of information and measurement systems, methods of reproducing units of electric circuit parameters, development of specialized information and measurement systems, mathematical methods of processing measurement information, models of formation of information signals and fields, statistical diagnostic methods, information support of testing, and calibration laboratories.

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Details

  • ISBN-13: 9783031407178
  • ISBN-10: 3031407172
  • Publisher: Springer
  • Publish Date: September 2023
  • Dimensions: 9.29 x 6.22 x 0.79 inches
  • Shipping Weight: 1.45 pounds
  • Page Count: 277

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