{
"item_title" : "Advanced VLSI Design and Testability Issues",
"item_author" : [" Suman Lata Tripathi", "Sobhit Saxena", "Sushanta Kumar Mohapatra "],
"item_description" : "This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book. ",
"item_img_path" : "https://covers4.booksamillion.com/covers/bam/0/36/749/282/0367492822_b.jpg",
"price_data" : {
"retail_price" : "150.00", "online_price" : "150.00", "our_price" : "150.00", "club_price" : "150.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : ""
}
}
Advanced VLSI Design and Testability Issues
Other Available Formats
Overview
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
This item is Non-Returnable
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Details
- ISBN-13: 9780367492823
- ISBN-10: 0367492822
- Publisher: CRC Press
- Publish Date: August 2020
- Dimensions: 9.21 x 6.14 x 0.88 inches
- Shipping Weight: 1.56 pounds
- Page Count: 360
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