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{ "item_title" : "Advances in Image Processing, Reliability, and Artificial Intelligence", "item_author" : [" Mario J. Divan", "Prashant Johri", "Francesc Guim "], "item_description" : "Advances in Image Processing, Reliability, and Artificial Intelligence: Data Centred-Techniques and Applications in Edge Computing provides a clear outlook of the mechanisms, risks, challenges, and opportunities in system reliability for image processing and AI applications running on edge devices. It provides Best Known Configuration (BKC) and Methods (BKM) while discussing trends and future works based on current research. The content serves as a reference for practitioners and provides a state-of-the-art for researchers in the area. It provides foundations to analyse and replicate different applications through use cases. It tackles concerns for how reliability aspects (i.e., fault tolerance, availability, maturity, and recoverability) are addressed for applications running in an environment that is not fully controlled and exposed to environmental variations.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/0/44/334/266/0443342660_b.jpg", "price_data" : { "retail_price" : "200.00", "online_price" : "200.00", "our_price" : "200.00", "club_price" : "200.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Advances in Image Processing, Reliability, and Artificial Intelligence|Mario J. Divan

Advances in Image Processing, Reliability, and Artificial Intelligence : Data Centred-Techniques and Applications in Edge Computing

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Overview

Advances in Image Processing, Reliability, and Artificial Intelligence: Data Centred-Techniques and Applications in Edge Computing provides a clear outlook of the mechanisms, risks, challenges, and opportunities in system reliability for image processing and AI applications running on edge devices. It provides Best Known Configuration (BKC) and Methods (BKM) while discussing trends and future works based on current research. The content serves as a reference for practitioners and provides a state-of-the-art for researchers in the area. It provides foundations to analyse and replicate different applications through use cases. It tackles concerns for how reliability aspects (i.e., fault tolerance, availability, maturity, and recoverability) are addressed for applications running in an environment that is not fully controlled and exposed to environmental variations.

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Details

  • ISBN-13: 9780443342660
  • ISBN-10: 0443342660
  • Publisher: Elsevier
  • Publish Date: November 2025
  • Dimensions: 10.88 x 8.51 x 0.8 inches
  • Shipping Weight: 2 pounds
  • Page Count: 314

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