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{ "item_title" : "Analog Circuit Design for Process Variation-Resilient Systems-On-A-Chip", "item_author" : [" Marvin Onabajo", "Jose Silva-Martinez "], "item_description" : "This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.", "item_img_path" : "https://covers4.booksamillion.com/covers/bam/1/48/999/296/1489992960_b.jpg", "price_data" : { "retail_price" : "109.99", "online_price" : "109.99", "our_price" : "109.99", "club_price" : "109.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Analog Circuit Design for Process Variation-Resilient Systems-On-A-Chip|Marvin Onabajo

Analog Circuit Design for Process Variation-Resilient Systems-On-A-Chip

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Overview

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.

  • Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
  • Includes built-in testing techniques, linked to current industrial trends;
  • Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
  • Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

This item is Non-Returnable

Details

  • ISBN-13: 9781489992963
  • ISBN-10: 1489992960
  • Publisher: Springer
  • Publish Date: April 2014
  • Dimensions: 9.21 x 6.14 x 0.41 inches
  • Shipping Weight: 0.61 pounds
  • Page Count: 174

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