{
"item_title" : "Analog Circuit Design for Process Variation-Resilient Systems-On-A-Chip",
"item_author" : [" Marvin Onabajo", "Jose Silva-Martinez "],
"item_description" : "This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.",
"item_img_path" : "https://covers4.booksamillion.com/covers/bam/1/48/999/296/1489992960_b.jpg",
"price_data" : {
"retail_price" : "109.99", "online_price" : "109.99", "our_price" : "109.99", "club_price" : "109.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : ""
}
}
Analog Circuit Design for Process Variation-Resilient Systems-On-A-Chip
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Overview
This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.
- Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
- Includes built-in testing techniques, linked to current industrial trends;
- Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
- Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.
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Details
- ISBN-13: 9781489992963
- ISBN-10: 1489992960
- Publisher: Springer
- Publish Date: April 2014
- Dimensions: 9.21 x 6.14 x 0.41 inches
- Shipping Weight: 0.61 pounds
- Page Count: 174
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