{ "item_title" : "Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation", "item_author" : [" M. E. Fitzpatrick", "Alain Lodini "], "item_description" : "Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the theoretical basis of stress analysis by diffraction methods, the practical implementation of the methods, and examples of key areas of application. Applications include the determination of internal stresses in weldments, in composite materials, following shot peening, and in ceramics. Discussions include problems in making measurements on textured samples.", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/1/42/002/358/1420023586_b.jpg", "price_data" : { "retail_price" : "169.95", "online_price" : "169.95", "our_price" : "169.95", "club_price" : "169.95", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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