{ "item_title" : "Atomic Force Microscopy", "item_author" : [" Victor Bellitto "], "item_description" : "With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/9/53/510/414/9535104144_b.jpg", "price_data" : { "retail_price" : "155.00", "online_price" : "155.00", "our_price" : "155.00", "club_price" : "155.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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