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"item_title" : "Built-In-Self-Test and Digital Self-Calibration for RF Socs",
"item_author" : [" Sleiman Bou-Sleiman", "Mohammed Ismail "],
"item_description" : "This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
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Built-In-Self-Test and Digital Self-Calibration for RF Socs
Overview
This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
This item is Non-Returnable
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Details
- ISBN-13: 9781441995476
- ISBN-10: 1441995471
- Publisher: Springer
- Publish Date: September 2011
- Dimensions: 9.21 x 6.14 x 0.22 inches
- Shipping Weight: 0.36 pounds
- Page Count: 89
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