{ "item_title" : "Characterization of Nanostructures", "item_author" : [" Sverre Myhra", "John C. Rivière "], "item_description" : "Divided into two parts, this book provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures and discusses typical applications to single nanoscale objects, as well as ensembles of such objects. The authors focus on the needs in the research laboratory but also address the needs of quality control, industrial troubleshooting, and online analysis. They describe operational modes most relevant to nanoscale characterization, and offer unique content on systems of different dimensionalities and functionalities.", "item_img_path" : "https://covers3.booksamillion.com/covers/bam/1/13/819/863/1138198633_b.jpg", "price_data" : { "retail_price" : "106.99", "online_price" : "106.99", "our_price" : "106.99", "club_price" : "106.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

Overview

Customers Also Bought

Details