Critical Phenomena at Surfaces and Interfaces : Evanescent X-Ray and Neutron Scattering
Overview
This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
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Details
- ISBN-13: 9783662149751
- ISBN-10: 3662149753
- Publisher: Springer
- Publish Date: October 2013
- Dimensions: 9.21 x 6.14 x 0.34 inches
- Shipping Weight: 0.51 pounds
- Page Count: 149
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