{ "item_title" : "Design for Manufacturability and Statistical Design", "item_author" : [" Michael Orshansky", "Sani Nassif", "Duane Boning "], "item_description" : "Sources of Variability.- Front End Variability.- Back End Variability.- Environmental Variability.- Variability Characterization and Analysis.- Test Structures For Variability.- Statistical Foundations Of Data Analysis And Modeling.- Design Techniques for Systematic Manufacturability Problems.- Lithography Enhancement Techniques.- Ensuring Interconnect Planarity.- Statistical Circuit Design.- Statistical Circuit Analysis.- Statistical Static Timing Analysis.- Leakage Variability And Joint Parametric Yield.- Parametric Yield Optimization.- Conclusions.", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/1/44/194/044/1441940448_b.jpg", "price_data" : { "retail_price" : "169.99", "online_price" : "169.99", "our_price" : "169.99", "club_price" : "169.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

Overview

Customers Also Bought

Details