menu
{ "item_title" : "Design and Test Technology for Dependable Systems-on-Chip", "item_author" : [" Raimund Ubar", "Jaan Raik", "Heinrich Theodor Vierhaus "], "item_description" : "Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined classical design and test topics and solutions for IC test technology and fault-tolerant systems.", "item_img_path" : "https://covers4.booksamillion.com/covers/bam/1/60/960/212/1609602129_b.jpg", "price_data" : { "retail_price" : "180.00", "online_price" : "180.00", "our_price" : "180.00", "club_price" : "180.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Design and Test Technology for Dependable Systems-on-Chip|Raimund Ubar

Design and Test Technology for Dependable Systems-on-Chip

local_shippingShip to Me
In Stock.
FREE Shipping for Club Members help

Overview

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

This item is Non-Returnable

Details

  • ISBN-13: 9781609602123
  • ISBN-10: 1609602129
  • Publisher: Information Science Reference
  • Publish Date: March 2011
  • Dimensions: 11.2 x 8.6 x 1.4 inches
  • Shipping Weight: 3.55 pounds
  • Page Count: 580

Related Categories

You May Also Like...

    1

BAM Customer Reviews