{ "item_title" : "Designer's Guide to Testable ASIC Devices", "item_author" : [" Wayne M. Needham "], "item_description" : "While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/0/44/200/221/0442002211_b.jpg", "price_data" : { "retail_price" : "169.99", "online_price" : "169.99", "our_price" : "169.99", "club_price" : "169.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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