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Development, Design and Analysis of Type-II Hetero-Strained Nanosystem|Rasmita Barik

Development, Design and Analysis of Type-II Hetero-Strained Nanosystem

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Overview

This book investigates the advancement and analysis of strained channel cylindrical gate-all-around (CGAA) FETs. The study explores a nano-scale design incorporating three ultrathin strained layers: two outer layers of strained silicon (s-Si) and a middle layer of strained silicon germanium (s-SiGe), forming a heterostructure-on-insulator (HOI) within the CGAA FET. These strained layers in the channel effectively confine quantum carriers, thereby enhancing carrier mobility and reducing threshold voltage roll-off.

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Details

  • ISBN-13: 9786200381583
  • ISBN-10: 6200381585
  • Publisher: LAP Lambert Academic Publishing
  • Publish Date: September 2025
  • Dimensions: 9 x 6 x 0.41 inches
  • Shipping Weight: 0.55 pounds
  • Page Count: 180

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