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"item_title" : "Digital Hardware Testing",
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"item_description" : "Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.",
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Digital Hardware Testing : Transistor-Level Fault Modeling and Testing
Overview
Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.
This item is Non-Returnable
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Details
- ISBN-13: 9780890065808
- ISBN-10: 0890065802
- Publisher: Artech House Publishers
- Publish Date: December 1992
- Dimensions: 9.36 x 6.26 x 0.91 inches
- Shipping Weight: 1.4 pounds
- Page Count: 340
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