{ "item_title" : "The Effect of Nuclear Reactions on Integrated Circuit Reliability", "item_author" : [" Nathaniel Dodds "], "item_description" : "Direct charge collection measurements are presented which prove that the presence of tungsten near sensitive volumes leads to extreme charge collection events through nuclear reactions. We demonstrate that, for a fixed incident particle linear energy transfer (LET), increasing particle energy beyond a certain point causes a decrease in nuclear reaction-induced charge collection. This suggests that a worst-case energy exists for single-event effect susceptibility, which depends on the technology, device layout, and the incident ions' fixed LET value. A Monte Carlo approach for identifying the worst-case energy is applied to certain bulk-Si and silicon-on-insulator technologies. Simulation results suggest that the decrease in charge collection beyond the worst-case energy occurs because the secondary particles produced from the high-energy nuclear reactions have less mass and higher energy and are therefore less ionizing than those produced by lower-energy reactions.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/3/63/924/128/3639241282_b.jpg", "price_data" : { "retail_price" : "52.92", "online_price" : "52.92", "our_price" : "52.92", "club_price" : "52.92", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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