{
"item_title" : "Enhanced Virtual Prototyping for Heterogeneous Systems",
"item_author" : [" Muhammad Hassan", "Daniel Große", "Rolf Drechsler "],
"item_description" : "This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security.Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs;Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models;Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs;Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.",
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Enhanced Virtual Prototyping for Heterogeneous Systems
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Overview
This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security.
- Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs;
- Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models;
- Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs;
- Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.
This item is Non-Returnable
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Details
- ISBN-13: 9783031055768
- ISBN-10: 3031055764
- Publisher: Springer
- Publish Date: September 2023
- Dimensions: 9.21 x 6.14 x 0.4 inches
- Shipping Weight: 0.6 pounds
- Page Count: 166
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