{ "item_title" : "European Test Workshop (Etw 2000) [Postproceedings]", "item_author" : [" IEEE "], "item_description" : "The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem", "item_img_path" : "https://covers4.booksamillion.com/covers/bam/0/76/950/701/0769507018_b.jpg", "price_data" : { "retail_price" : "115.00", "online_price" : "115.00", "our_price" : "115.00", "club_price" : "115.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

Overview

Customers Also Bought

Details