{ "item_title" : "Extreme Statistics in Nanoscale Memory Design", "item_author" : [" Amith Singhee", "Rob A. Rutenbar "], "item_description" : "Extreme Statistics in Memories.- Statistical Nano CMOS Variability and Its Impact on SRAM.- Importance Sampling-Based Estimation: Applications to Memory Design.- Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics.- Yield Estimation by Computing Probabilistic Hypervolumes.- Most Probable Point-Based Methods.- Extreme Value Theory: Application to Memory Statistics.", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/1/46/142/672/1461426723_b.jpg", "price_data" : { "retail_price" : "169.99", "online_price" : "169.99", "our_price" : "169.99", "club_price" : "169.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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