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2003 IEEE International Conference on Simulation of Semiconductor Processes and Devices : Sispad 2003: Boston, Massachusetts, USA, 3-5 September, 2003
Overview
Taken from the proceedings of the 2003 International Conference of the Simulation of Semiconductor Processes and Devices (SISPAD 2003), this volume looks at electron devices.
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Details
- ISBN-13: 9780780378261
- ISBN-10: 0780378261
- Publisher: IEEE Computer Society Press
- Publish Date: September 2003
- Dimensions: 10.98 x 8.5 x 0.71 inches
- Page Count: 329
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