{ "item_title" : "Imperfection and Thickness Measurement of Panels Using a Coordinate Measurement Machine", "item_author" : [" Nasa Technical Reports Server (Ntrs)", "Robert P. Thornburgh "], "item_description" : "This paper summarizes the methodology used to measure imperfection and thickness variation for flat and curved panels using a Coordinate Measurement Machine (CMM) and the software program MeasPanel. The objective is to provide a reference document so that someone with a basic understanding of CMM operation can measure a panel with minimal training. Detailed information about both the measurement system setup and computer software is provided. Information is also provided about the format of the raw data, as well as how it is post-processed for use in finite-element analysis.", "item_img_path" : "https://covers3.booksamillion.com/covers/bam/1/28/914/393/1289143935_b.jpg", "price_data" : { "retail_price" : "14.75", "online_price" : "14.75", "our_price" : "14.75", "club_price" : "14.75", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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