{
"item_title" : "Infrared Characterization for Microelectronics",
"item_author" : [" Wai Shing Lau "],
"item_description" : "Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the book will be on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement will be discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.",
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Infrared Characterization for Microelectronics
Overview
Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the book will be on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement will be discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.
This item is Non-Returnable
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Details
- ISBN-13: 9789810223526
- ISBN-10: 9810223528
- Publisher: World Scientific Publishing Company
- Publish Date: October 1999
- Dimensions: 8.7 x 6.1 x 0.6 inches
- Shipping Weight: 0.79 pounds
- Page Count: 172
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