{ "item_title" : "Ionizing Radiation Effects in Mos Devices and Circuits", "item_author" : [" T. P. Ma", "Paul V. Dressendorfer "], "item_description" : "This is the first comprehensive overview describing the effects of ionizing radiation on MOS devices, and how to design, fabricate, and test integrated circuits intended for use in a radiation environment. It also addresses process-induced radiation effects in the fabrication of high-density circuits, and reviews the history of radiation-hard technology, providing background information for those new to the field. The book includes a comprehensive review of the literature, and an annotated listing of research activities in radiation-hardness research. The volume will be of benefit to semi conductor process development engineers, device and circuit development engineers, device physicists, reliability assurance engineers, project managers and stress analysts.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/0/47/184/893/047184893X_b.jpg", "price_data" : { "retail_price" : "372.95", "online_price" : "372.95", "our_price" : "372.95", "club_price" : "372.95", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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