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Kelvin Probe Force Microscopy|Sascha Sadewasser

Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization

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Overview


Presents the applications of Kelvin probe force microscopy in nanotechnology

Provides an in-depth description of a variety of theoretical and experimental aspects of the technique

Includes contributions by the leading experts in the field


This item is Non-Returnable

Details

  • ISBN-13: 9783030092986
  • ISBN-10: 3030092984
  • Publisher: Springer
  • Publish Date: January 2019
  • Dimensions: 9.21 x 6.14 x 1.11 inches
  • Shipping Weight: 1.67 pounds
  • Page Count: 521

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