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Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization
by Sascha Sadewasser and Thilo Glatzel
Overview
Presents the applications of Kelvin probe force microscopy in nanotechnology
Provides an in-depth description of a variety of theoretical and experimental aspects of the technique
Includes contributions by the leading experts in the field
This item is Non-Returnable
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Details
- ISBN-13: 9783030092986
- ISBN-10: 3030092984
- Publisher: Springer
- Publish Date: January 2019
- Dimensions: 9.21 x 6.14 x 1.11 inches
- Shipping Weight: 1.67 pounds
- Page Count: 521
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