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{ "item_title" : "Microelectronic Test Structures for CMOS Technology", "item_author" : [" Manjul Bhushan", "Mark B. Ketchen "], "item_description" : "Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.", "item_img_path" : "https://covers3.booksamillion.com/covers/bam/1/44/199/376/1441993762_b.jpg", "price_data" : { "retail_price" : "199.99", "online_price" : "199.99", "our_price" : "199.99", "club_price" : "199.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Microelectronic Test Structures for CMOS Technology|Manjul Bhushan

Microelectronic Test Structures for CMOS Technology

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Overview

Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.

This item is Non-Returnable

Details

  • ISBN-13: 9781441993762
  • ISBN-10: 1441993762
  • Publisher: Springer
  • Publish Date: August 2011
  • Dimensions: 9.21 x 6.14 x 0.94 inches
  • Shipping Weight: 1.64 pounds
  • Page Count: 373

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