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"item_title" : "Microelectronic Test Structures for CMOS Technology",
"item_author" : [" Manjul Bhushan", "Mark B. Ketchen "],
"item_description" : "Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.",
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Overview
Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.
This item is Non-Returnable
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Details
- ISBN-13: 9781489990556
- ISBN-10: 1489990550
- Publisher: Springer
- Publish Date: October 2014
- Dimensions: 9.21 x 6.14 x 0.84 inches
- Shipping Weight: 1.25 pounds
- Page Count: 373
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