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Microelectronic Test Structures for CMOS Technology|Manjul Bhushan

Microelectronic Test Structures for CMOS Technology

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Overview

Introduction.- Test Structure Basics.- Resistors.- Capacitors.- MOSFETs.- Ring Oscillators.- High Speed Characterization.- Test Structures of SOI Technology.- Test Equipment and Measurements.- Data Analysis.

This item is Non-Returnable

Details

  • ISBN-13: 9781489990556
  • ISBN-10: 1489990550
  • Publisher: Springer
  • Publish Date: October 2014
  • Dimensions: 9.21 x 6.14 x 0.84 inches
  • Shipping Weight: 1.25 pounds
  • Page Count: 373

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