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Optical Characterization of Microstructures and Optoelectronic Devices Based on Wide Band Gap Semiconductors
by Shijie Xu
Overview
This item is Non-Returnable
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Details
- ISBN-13: 9789819519279
- ISBN-10: 9819519276
- Publisher: Springer
- Publish Date: January 2026
- Dimensions: 9.37 x 6.48 x 0.88 inches
- Shipping Weight: 1.77 pounds
- Page Count: 373
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