{ "item_title" : "An Overview of X-Ray Analysis Technology", "item_author" : [" Wu Ruizhi", "Zhenqiang Wang "], "item_description" : "An Overview of X-ray Analysis Technology introduces the basic theoretical knowledge of X-ray physics, X-ray diffraction direction and intensity, polycrystalline X-ray diffraction analysis, etc. Various X-ray techniques commonly used in current scientific research are introduced in the book, including the use of X-ray diffraction technology to analyze the phase, residual stress, grain size, dislocation density, texture, etc. of materials, as well as the use of X-ray photoelectron spectroscopy to analyze the types and contents of surface elements of materials. The book also introduces the three-dimensional X-ray microscopy analysis method developed in recent years based on electronic computed tomography technology. Thee technologies covered introduce basic principles, methods, experimental operations, and case analysis.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/0/44/349/332/0443493324_b.jpg", "price_data" : { "retail_price" : "225.00", "online_price" : "225.00", "our_price" : "225.00", "club_price" : "225.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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