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Particle Characterization in Technology|J. K. Beddow

Particle Characterization in Technology : Volume II: Morphological Analysis

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Overview

The first section of volume II deals with both theory and methods of morphological analysis, it then discusses data analysis, and finally, the applications.

This item is Non-Returnable

Details

  • ISBN-13: 9781315896267
  • ISBN-10: 1315896265
  • Publisher: CRC Press
  • Publish Date: November 2017
  • Dimensions: 10.09 x 7.1 x 0.8 inches
  • Shipping Weight: 1.45 pounds
  • Page Count: 288

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