Overview
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
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Details
- ISBN-13: 9780824795351
- ISBN-10: 0824795350
- Publisher: CRC Press
- Publish Date: December 1994
- Dimensions: 9.24 x 5.9 x 0.88 inches
- Shipping Weight: 1.75 pounds
- Page Count: 422
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