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Photo-Induced Defects in Semiconductors
by David Redfield and Richard H. Bube
Other Available Formats
Overview
Photoinduced Defects in Semiconductors is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors that can be created or destroyed by light.
This item is Non-Returnable
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Details
- ISBN-13: 9780521461962
- ISBN-10: 0521461960
- Publisher: Cambridge University Press
- Publish Date: January 1996
- Dimensions: 9.28 x 6.23 x 0.81 inches
- Shipping Weight: 1.06 pounds
- Page Count: 230
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