{ "item_title" : "Physics and Electrical Diagnostics of Silicon-On-Insulator Nanoelectronic Structures and Devices", "item_author" : [" Tamara Rudenko", "Alexei Oleksiy Nazarov", "Volodymyr Lysenko "], "item_description" : "This book provides a comprehensive treatment of silicon-on-insulator (SOI) nanoelectronic structures and devices, covering the evolution of SOI technology, wafer fabrication methods, the physics of SOI MOS structures, and the scaling challenges of nanoscale transistors. It presents a detailed overview of electrical characterization and parameter-extraction techniques, including threshold-voltage determination, capacitance-voltage analysis, carrier mobility measurements, and methods for investigating generation and recombination processes. The book further examines the electrical properties and performance of advanced SOI device architectures, including ultra-thin-body MOSFETs, triple-gate FinFETs, and junctionless nanowire transistors, linking fundamental semiconductor physics with practical approaches for evaluating and optimizing next-generation nanoelectronic devices. ", "item_img_path" : "https://covers4.booksamillion.com/covers/bam/3/03/241/969/3032419697_b.jpg", "price_data" : { "retail_price" : "199.99", "online_price" : "199.99", "our_price" : "199.99", "club_price" : "199.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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