{ "item_title" : "Proceedings", "item_author" : [" IEEE Computer Society "], "item_description" : "A May 2008 symposium discussed trends, emerging results, hot topics, and practical applications in the area of electronic-based circuit and systems testing. Papers from the symposium are presented here, in sections on testing and monitoring for high-quality requirements, SoC infrastructure and testing, advances in RF testing, safe test generation and design validation, memory test, industrial applications, simulation and test generation of delay faults, on-chip resources for mixed-signal devices, solutions for yield enhancement, on-line checking, and soft error mitigation. Some specific areas described are bridge defect diagnosis for multiple-voltage design, bypassing blocking bugs during post-silicon validation, accelerated shift registers for x-tolerant test data compaction, and jitter decomposition in high-speed communication systems. There is no subject index.", "item_img_path" : "https://covers3.booksamillion.com/covers/bam/0/76/953/150/0769531504_b.jpg", "price_data" : { "retail_price" : "187.00", "online_price" : "187.00", "our_price" : "187.00", "club_price" : "187.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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