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Progress in Nanoscale Characterization and Manipulation
Overview
Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials research
Showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy
Explores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniques
This item is Non-Returnable
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Details
- ISBN-13: 9789811344206
- ISBN-10: 9811344205
- Publisher: Springer
- Publish Date: January 2019
- Dimensions: 9.21 x 6.14 x 1.04 inches
- Shipping Weight: 1.58 pounds
- Page Count: 508
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