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Random Fluctuations and Pattern Growth : Experiments and Models
by Harry Eugene Stanley and N. Ostrowsky
Overview
Proceedings of the NATO Advanced Study Institute, Carg se, Corsica, France, 18-31 July, 1988
This item is Non-Returnable
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Details
- ISBN-13: 9780792300731
- ISBN-10: 0792300734
- Publisher: Springer
- Publish Date: November 1988
- Dimensions: 9.21 x 6.14 x 0.77 inches
- Shipping Weight: 1.15 pounds
- Page Count: 356
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