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{ "item_title" : "Reliability Physics and Engineering", "item_author" : [" J. W. McPherson "], "item_description" : "Provides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications Explains the fundamentals of reliability physics and engineering tools for building better products Contains statistical training and tools within the text Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.", "item_img_path" : "https://covers3.booksamillion.com/covers/bam/3/31/993/682/3319936824_b.jpg", "price_data" : { "retail_price" : "119.99", "online_price" : "119.99", "our_price" : "119.99", "club_price" : "119.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Reliability Physics and Engineering|J. W. McPherson

Reliability Physics and Engineering : Time-To-Failure Modeling

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Overview

Provides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications

Explains the fundamentals of reliability physics and engineering tools for building better products

Contains statistical training and tools within the text

Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.

This item is Non-Returnable

Details

  • ISBN-13: 9783319936826
  • ISBN-10: 3319936824
  • Publisher: Springer
  • Publish Date: January 2019
  • Dimensions: 9.21 x 6.14 x 1.06 inches
  • Shipping Weight: 1.87 pounds
  • Page Count: 463

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