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Reliability Physics and Engineering : Time-To-Failure Modeling
Overview
Provides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications
Explains the fundamentals of reliability physics and engineering tools for building better products
Contains statistical training and tools within the text
Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.
This item is Non-Returnable
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Details
- ISBN-13: 9783319936826
- ISBN-10: 3319936824
- Publisher: Springer
- Publish Date: January 2019
- Dimensions: 9.21 x 6.14 x 1.06 inches
- Shipping Weight: 1.87 pounds
- Page Count: 463
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