{
"item_title" : "Run-To-Run Control in Semiconductor Manufacturing",
"item_author" : [" James Moyne", "Enrique Del Castillo", "Arnon M. Hurwitz "],
"item_description" : "Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine runs, thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.",
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Run-To-Run Control in Semiconductor Manufacturing
Overview
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry's widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
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Details
- ISBN-13: 9780849311789
- ISBN-10: 0849311780
- Publisher: CRC Press
- Publish Date: November 2000
- Dimensions: 9.52 x 6.35 x 0.88 inches
- Shipping Weight: 1.36 pounds
- Page Count: 366
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