{ "item_title" : "Scanning Electron Microscopy", "item_author" : [" P. W. Hawkes", "Ludwig Reimer "], "item_description" : "Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.", "item_img_path" : "https://covers4.booksamillion.com/covers/bam/3/64/208/372/3642083722_b.jpg", "price_data" : { "retail_price" : "379.00", "online_price" : "379.00", "our_price" : "379.00", "club_price" : "379.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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