{ "item_title" : "Scanning Probe Microscopy", "item_author" : [" Jayne C. Garno", "Song Xu", "Jing-Jiang Yu "], "item_description" : "One may think that scanning probe microscopy (SPM) instruments are mainly used to 'look' at a surface, as with an optical microscope. However, SPM encompasses dozens of measurement and lithography modes for fundamental studies and applications spanning a broad range of scientific disciplines, such as chemistry, physics, engineering, material science, nanoscience / nanomedicine, and biology. New SPM technologies enable mapping of surface properties and surface manipulation with atomic precision, which makes it now a standard and indispensable tool in labs across these disciplines.This book provides a comprehensive and high-level guide to the operating principles of a wide array of SPM instruments. While the well-known atomic force microscopy (AFM) is covered in-depth in 9 chapters, modern variants are also introduced, such as chemical force microscopy, magnetic force microscopy, scanning electrochemical microscopy, and near-field scanning optical microscopy, amongst many others, concluding with the futuristic artificial intelligence-driven SPM. The authors -- one an accomplished Professor of Chemistry and the others senior research scientists with major SPM companies -- explain how the science translates into cutting-edge technology and industrial applications.", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/9/81/126/474/9811264740_b.jpg", "price_data" : { "retail_price" : "108.00", "online_price" : "108.00", "our_price" : "108.00", "club_price" : "108.00", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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