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Semiconductor Reliability, V2|William H. Von Alven

Semiconductor Reliability, V2

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Overview

Additional Contributors Include A. Procassini, A. Romano, Lawrence F. Jones And Others.

This item is Non-Returnable

Details

  • ISBN-13: 9781258727116
  • ISBN-10: 1258727110
  • Publisher: Literary Licensing, LLC
  • Publish Date: May 2013
  • Dimensions: 9.02 x 5.98 x 0.85 inches
  • Shipping Weight: 1.22 pounds
  • Page Count: 416

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