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{ "item_title" : "Single-Photon Imaging", "item_author" : [" Peter Seitz", "Albert J. P. Theuwissen "], "item_description" : "Fundamentals of noise in optoelectronics.- Semiconductor technology for single-photon image sensing.- Hybrid Avalanche Photodiode Array (APD) Imaging.- Electron Bombarded Semiconductor Image Sensors.- Silicon Photomultipliers, SiPM.- Electron-Multiplying CCDs, EMCCD.- Monolithic Single-Photon Avalanche Photodetectors, SPAD.- Single-photon CMOS imaging through bandwidth optimization.-Architectures for low-noise CMOS electronic imaging.-Low-noise electronic imaging with double-gate FETs and charge-modulation devices.- Energy-sensitive single-photon X-ray and particle imaging.- Single-photon imaging for astronomy and aerospace applications.- Single-photon imaging for the life sciences.- Single-photon imaging for time-of-flight range 3D imaging", "item_img_path" : "https://covers1.booksamillion.com/covers/bam/3/64/218/442/3642184421_b.jpg", "price_data" : { "retail_price" : "199.99", "online_price" : "199.99", "our_price" : "199.99", "club_price" : "199.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }
Single-Photon Imaging|Peter Seitz

Single-Photon Imaging

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Overview

Fundamentals of noise in optoelectronics.- Semiconductor technology for single-photon image sensing.- Hybrid Avalanche Photodiode Array (APD) Imaging.- Electron Bombarded Semiconductor Image Sensors.- Silicon Photomultipliers, SiPM.- Electron-Multiplying CCDs, EMCCD.- Monolithic Single-Photon Avalanche Photodetectors, SPAD.- Single-photon CMOS imaging through bandwidth optimization.-Architectures for low-noise CMOS electronic imaging.-Low-noise electronic imaging with double-gate FETs and charge-modulation devices.- Energy-sensitive single-photon X-ray and particle imaging.- Single-photon imaging for astronomy and aerospace applications.- Single-photon imaging for the life sciences.- Single-photon imaging for time-of-flight range 3D imaging

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Details

  • ISBN-13: 9783642184420
  • ISBN-10: 3642184421
  • Publisher: Springer
  • Publish Date: August 2011
  • Dimensions: 9.1 x 6.1 x 1.1 inches
  • Shipping Weight: 1.4 pounds
  • Page Count: 354

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