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{
"item_title" : "Software Defect and Operational Profile Modeling",
"item_author" : [" Kai-Yuan Cai "],
"item_description" : "also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1",
"item_img_path" : "https://covers2.booksamillion.com/covers/bam/1/46/137/559/1461375592_b.jpg",
"price_data" : {
"retail_price" : "219.99", "online_price" : "219.99", "our_price" : "219.99", "club_price" : "219.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : ""
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Overview
also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1
This item is Non-Returnable
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Details
- ISBN-13: 9781461375593
- ISBN-10: 1461375592
- Publisher: Springer
- Publish Date: October 2012
- Dimensions: 9.21 x 6.14 x 0.61 inches
- Shipping Weight: 0.91 pounds
- Page Count: 268
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