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Software Failure Investigation : A Near-Miss Analysis Approach
by Jan Eloff and Madeleine Bihina Bella
Overview
Investigates software failures in an operational environment through near-miss analysis;
Studies recent and major software failures of significant magnitude;
Provides a design of an architecture for a Near-Miss Management System
This item is Non-Returnable
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Details
- ISBN-13: 9783319613338
- ISBN-10: 3319613332
- Publisher: Springer
- Publish Date: September 2017
- Dimensions: 9.21 x 6.14 x 0.38 inches
- Shipping Weight: 0.8 pounds
- Page Count: 119
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