{
"item_title" : "Structural, Syntactic, and Statistical Pattern Recognition",
"item_author" : [" Dit-Yan Yeung", "James T. Kwok", "Ana Fred "],
"item_description" : "This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.",
"item_img_path" : "https://covers4.booksamillion.com/covers/bam/3/54/037/236/3540372369_b.jpg",
"price_data" : {
"retail_price" : "109.99", "online_price" : "109.99", "our_price" : "109.99", "club_price" : "109.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : ""
}
}
Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19
Overview
This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.
This item is Non-Returnable
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Details
- ISBN-13: 9783540372363
- ISBN-10: 3540372369
- Publisher: Springer
- Publish Date: August 2006
- Dimensions: 9.34 x 6.06 x 1.24 inches
- Shipping Weight: 2.36 pounds
- Page Count: 939
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