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Structure Analysis of Advanced Nanomaterials : Nanoworld by High-Resolution Electron Microscopy
by Takeo Oku
Overview
High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.
This item is Non-Returnable
Details
- ISBN-13: 9783110304725
- ISBN-10: 3110304724
- Publisher: de Gruyter
- Publish Date: September 2014
- Dimensions: 9.61 x 6.69 x 0.44 inches
- Shipping Weight: 1.08 pounds
- Page Count: 178
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