{ "item_title" : "Topics in Electron Diffraction and Microscopy of Materials", "item_author" : [" Peter B. Hirsch "], "item_description" : "This book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, and RHEED observations for MBE growth.", "item_img_path" : "https://covers2.booksamillion.com/covers/bam/0/75/030/538/075030538X_b.jpg", "price_data" : { "retail_price" : "249.99", "online_price" : "249.99", "our_price" : "249.99", "club_price" : "249.99", "savings_pct" : "0", "savings_amt" : "0.00", "club_savings_pct" : "0", "club_savings_amt" : "0.00", "discount_pct" : "10", "store_price" : "" } }

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