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"item_description" : "Introduction and Background.- History of the Observed Centres in Silicon.- Experimental Method.- Results.- Discussion and Conclusion.",
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Transition-Metal Defects in Silicon : New Insights from Photoluminescence Studies of Highly Enriched 28si
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Overview
Introduction and Background.- History of the Observed Centres in Silicon.- Experimental Method.- Results.- Discussion and Conclusion.
This item is Non-Returnable
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Details
- ISBN-13: 9783642350788
- ISBN-10: 364235078X
- Publisher: Springer
- Publish Date: March 2013
- Dimensions: 9.2 x 6.2 x 0.5 inches
- Shipping Weight: 0.65 pounds
- Page Count: 97
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